Large Solid Angle Silicon Drift Detectors for EDX Analysis in TEM
نویسندگان
چکیده
منابع مشابه
Analysis of Background Events in Silicon Drift Detectors
Measurements of the energy resolution and the peak-to-background ratio of a Silicon Drift Detector at several positions and biasing voltages are performed. The origins of events with partial charge collection, which contribute to the background, are identified. A model describing the different mechanisms and the spatial distribution of partial events is developed. By optimizing the biasing volt...
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ژورنال
عنوان ژورنال: Microscopy and Microanalysis
سال: 2014
ISSN: 1431-9276,1435-8115
DOI: 10.1017/s1431927614007351